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Low-leakage asymmetric-cell SRAM

机译:低泄漏非对称单元SRAM

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摘要

We introduce a novel family of asymmetric dual-Vt static random access memory cell designs that reduce leakage power in caches while maintaining low access latency. Our designs exploit the strong bias toward zero at the bit level exhibited by the memory value stream of ordinary programs. Compared to conventional symmetric high-performance cells, our cells offer significant leakage reduction in the zero state and, in some cases, also in the one state, albeit to a lesser extent. A novel sense amplifier, in combination with dummy bitlines, allows for read times to be on par with conventional symmetric cells. With one cell design, leakage is reduced by 7× (in the zero state) with no performance degradation, but with a stability degradation of 6%. Another cell design reduces leakage by 2× (in the zero state) with no performance or stability loss. An alternative cell design reduces leakage by 58× (in the zero state) with a performance degradation of 1% and an area increase of 2.4% and no stability degradation.
机译:我们介绍了一种新颖的非对称双Vt静态随机存取存储器单元设计系列,该设计可减少高速缓存中的泄漏功率,同时保持较低的访问延迟。我们的设计在普通程序的内存值流所展现的位水平上利用了向零的强偏差。与传统的对称高性能电池相比,我们的电池在零状态下以及在某些情况下甚至在一种状态下都可显着降低泄漏,尽管程度较小。一种新颖的读出放大器,与虚拟位线结合,可以使读取时间与传统的对称单元相提并论。采用一种电池设计,泄漏量减少了7倍(在零状态下),而性能没有下降,但稳定性下降了6%。另一种电池设计可将泄漏减少2倍(在零状态下),而不会降低性能或稳定性。另一种电池设计可将泄漏减少58倍(在零状态下),性能下降1%,面积增加2.4%,而稳定性没有下降。

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