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Global interconnect design in a three-dimensional system-on-a-chip

机译:三维片上系统中的全局互连设计

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摘要

A stochastic model for the global net-length distribution of a three-dimensional system-on-a-chip (3D-SoC) is derived. Using the results of this model, a global interconnect design window for a 3D-SoC is established by evaluating the constraints of: 1) wiring area; 2) clock wiring bandwidth; and 3) crosstalk noise. This window elucidates the optimum 3D-SoC global interconnect parameters for minimum pitch, minimum aspect ratio, and maximum clock frequency. In comparison to a two-dimensional system-on-a-chip (2D-SoC), the design window expands for a 3D-SoC to allow greater flexibility of interconnect parameters, thus increasing the guardbands to process variations. In addition, the limit on the maximum global clock frequency is revealed to increase as S2, where S is the number of strata. This increase in on-chip signaling rate, however, comes at the expense of I/O density, highlighting the need for new high-density-I/O packaging techniques to exploit the full potential of 3D-SoC.
机译:推导了三维片上系统(3D-SoC)的全球净长度分布的随机模型。利用该模型的结果,可以通过评估以下方面的约束来建立3D-SoC的全局互连设计窗口:1)布线面积; 2)时钟接线带宽; 3)串扰噪声。该窗口阐明了针对最小间距,最小纵横比和最大时钟频率的最佳3D-SoC全局互连参数。与二维片上系统(2D-SoC)相比,设计窗口针对3D-SoC进行了扩展,以允许更大的互连参数灵活性,从而增加了保护带以应对工艺变化。另外,最大全局时钟频率的限制显示为随着S2的增加而增加,其中S是层数。然而,这种片上信号速率的提高是以I / O密度为代价的,这突出表明需要新的高密度I / O封装技术来充分利用3D-SoC的潜力。

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