首页> 外文会议>Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International >A global interconnect design window for a three-dimensional system-on-a-chip
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A global interconnect design window for a three-dimensional system-on-a-chip

机译:三维片上系统的全局互连设计窗口

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A global interconnect design window for a three-dimensional system-on-a-chip (3D-SoC) is established by evaluating the constraints of 1) wiring area, 2) clock wiring bandwidth, and 3) crosstalk noise. This window elucidates the optimum 3D-SoC global interconnect parameters for minimum pitch, minimum aspect ratio, or maximum clock frequency. In comparison to a two-dimensional system-on-a-chip (2D-SoC), the design window is greatly expanded for a 3D-SoC, thus reducing the sensitivity to interconnect parameter variations. In addition, the maximum global clock frequency is revealed to increase as S/sup 1.5/, where S is the number of strata. For example, a 3D-SoC with two strata has a maximum global clock frequency 2.8 times that of a 2D-SoC. This increase in on-chip bandwidth, however, comes at the expense of I/O density, highlighting the necessity for new high-density-I/O packaging techniques.
机译:通过评估以下因素的限制,可以建立3D片上系统(3D-SoC)的全局互连设计窗口:1)布线面积,2)时钟布线带宽和3)串扰噪声。该窗口阐明了针对最小间距,最小纵横比或最大时钟频率的最佳3D-SoC全局互连参数。与二维片上系统(2D-SoC)相比,3D-SoC的设计窗口大大扩展了,从而降低了互连参数变化的敏感性。另外,最大全局时钟频率显示为增加为S / sup 1.5 /,其中S是层数。例如,具有两个层次的3D-SoC的最大全局时钟频率是2D-SoC的2.8倍。但是,这种片上带宽的增加是以I / O密度为代价的,这突出表明了新的高密度I / O封装技术的必要性。

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