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Leakage current reduction in CMOS VLSI circuits by input vector control

机译:通过输入矢量控制减少CMOS VLSI电路中的漏电流

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The first part of this paper describes two runtime mechanisms for reducing the leakage current of a CMOS circuit. In both cases, it is assumed that the system or environment produces a "sleep" signal that can be used to indicate that the circuit is in a standby mode. In the first method, the "sleep" signal is used to shift in a new set of external inputs and pre-selected internal signals into the circuit with the goal of setting the logic values of all of the internal signals so as to minimize the total leakage current in the circuit. This minimization is possible because the leakage current of a CMOS gate is strongly dependent on the input combination applied to its inputs. In the second method, nMOS and pMOS transistors are added to some of the gates in the circuit to increase the controllability of the internal signals of the circuit and decrease the leakage current of the gates using the "stack effect". This is, however, done carefully so that the minimum leakage is achieved subject to a delay constraint for all input-output paths in the circuit. In both cases, Boolean satisfiability is used to formulate the problems, which are subsequently solved by employing a highly efficient SAT solver. Experimental results on the combinational circuits in the MCNC91 benchmark suite demonstrate that it is possible to reduce the leakage current in combinational circuits by an average of 25% with only a 5% delay penalty. The second part of this paper presents a design technique for applying the minimum leakage input to a sequential circuit. The proposed method uses the built-in scan-chains in a VLSI circuit to drive it with the minimum leakage vector when it enters the sleep mode. The use of these scan registers eliminates the area and delay overhead of the additional circuitry that would otherwise be needed to apply the minimum leakage vector to the circuit. Experimental results on the sequential circuits in the MCNC91 benchmark suit show that, by using the proposed method, it is possible to reduce the leakage by an average of 25% with practically no delay penalty.
机译:本文的第一部分描述了两种用于减小CMOS电路泄漏电流的运行时机制。在这两种情况下,都假定系统或环境产生“休眠”信号,该信号可用于指示电路处于待机模式。在第一种方法中,“睡眠”信号用于将一组新的外部输入和预先选择的内部信号移入电路,目的是设置所有内部信号的逻辑值,以最大程度地减少总和。电路中的泄漏电流。这种最小化是可能的,因为CMOS门的泄漏电流很大程度上取决于应用于其输入的输入组合。在第二种方法中,将nMOS和pMOS晶体管添加到电路中的某些栅极,以利用“堆叠效应”增加电路内部信号的可控制性并降低栅极的泄漏电流。但是,要仔细进行,以使对电路中所有输入-输出路径的延迟限制都能达到最小泄漏。在这两种情况下,都使用布尔可满足性来表述问题,随后通过使用高效的SAT求解器来解决这些问题。 MCNC91基准套件中组合电路的实验结果表明,可以平均降低组合电路中的泄漏电流25%,而延迟损失仅为5%。本文的第二部分介绍了一种将最小泄漏输入应用于时序电路的设计技术。所提出的方法使用VLSI电路中的内置扫描链在进入睡眠模式时以最小的泄漏矢量来驱动它。这些扫描寄存器的使用消除了附加电路的面积和延迟开销,否则这些附加电路将向电路施加最小泄漏矢量所需。在MCNC91基准测试套件的时序电路上的实验结果表明,通过使用所提出的方法,可以平均减少25%的泄漏,而几乎没有延迟损失。

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