首页> 外文期刊>IEEE transactions on very large scale integration (VLSI) systems >A combined gate replacement and input vector control approach for leakage current reduction
【24h】

A combined gate replacement and input vector control approach for leakage current reduction

机译:栅极替换和输入矢量控制相结合的方法,可降低泄漏电流

获取原文
获取原文并翻译 | 示例

摘要

Input vector control (IVC) is a popular technique for leakage power reduction. It utilizes the transistor stack effect in CMOS gates by applying a minimum leakage vector (MLV) to the primary inputs of combinational circuits during the standby mode. However, the IVC technique becomes less effective for circuits of large logic depth because the input vector at primary inputs has little impact on leakage of internal gates at high logic levels. In this paper, we propose a technique to overcome this limitation by replacing those internal gates in their worst leakage states by other library gates while maintaining the circuit's correct functionality during the active mode. This modification of the circuit does not require changes of the design flow, but it opens the door for further leakage reduction when the MLV is not effective. We then present a divide-and-conquer approach that integrates gate replacement, an optimal MLV searching algorithm for tree circuits, and a genetic algorithm to connect the tree circuits. Our experimental results on all the MCNC91 benchmark circuits reveal that 1) the gate replacement technique alone can achieve 10% leakage current reduction over the best known IVC methods with no delay penalty and little area increase; 2) the divide-and-conquer approach outperforms the best pure IVC method by 24% and the existing control point insertion method by 12%; and 3) compared with the leakage achieved by optimal MLV in small circuits, the gate replacement heuristic and the divide-and-conquer approach can reduce on average 13% and 17% leakage, respectively.
机译:输入矢量控制(IVC)是降低泄漏功率的一种流行技术。它通过在待机模式下向组合电路的主要输入端施加最小泄漏矢量(MLV),从而利用CMOS栅极中的晶体管堆叠效应。但是,IVC技术对于逻辑深度较大的电路的有效性降低,因为主输入端的输入矢量对高逻辑电平的内部门的泄漏几乎没有影响。在本文中,我们提出了一种技术来克服此限制,方法是用其他库门代替那些处于最坏泄漏状态的内部门,同时在有源模式下保持电路的正确功能。电路的这种修改不需要更改设计流程,但是当MLV无效时,它为进一步减少泄漏打开了大门。然后,我们提出了一种分治法,该方法整合了门置换,用于树电路的最佳MLV搜索算法以及用于连接树电路的遗传算法。我们在所有MCNC91基准电路上的实验结果表明:1)仅是栅极替换技术,就可以比最著名的IVC方法减少10%的漏电流,而不会造成延迟损失和面积增加。 2)分治法比最佳的纯IVC方法高出24%,而现有的控制点插入法则高出12%;和3)与在小电路中通过最佳MLV实现的泄漏相比,栅极替换试探法和分治法可以分别平均减少13%和17%的泄漏。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号