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A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus

机译:互连总线中串扰影响的统一检测方案

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For very deep sub-micrometer VLSI, crosstalk becomes an important issue in affecting performance and signal integrity of the circuits. Two crosstalk fault effects, namely, glitch and crosstalk-induced delay, in the system-on-chip (SOC) interconnect bus are analyzed and a unified scheme to detect them is proposed and demonstrated in this paper. The crosstalk induced delay is found to be superposition of the induced glitch and the applied signal at the victim line, and this effect is more important in affecting the circuit performance. A pulse detector with an adjustable detection threshold is proposed to detect glitches and consequently the induced delay. Several issues affecting the yield of the proposed testing scheme are discussed and Monte Carlo simulations are conducted to show the feasibility of the scheme.
机译:对于非常深的亚微米级VLSI,串扰成为影响电路性能和信号完整性的重要问题。分析了片上系统互连总线中的两种串扰故障影响,即毛刺和串扰引起的延迟,并提出并演示了一种检测它们的统一方案。发现串扰引起的延迟是诱发毛刺和受害线处施加信号的叠加,这种影响在影响电路性能方面更为重要。提出了具有可调节的检测阈值的脉冲检测器,以检测毛刺并因此检测引起的延迟。讨论了影响拟议测试方案产量的几个问题,并进行了蒙特卡洛模拟,以证明该方案的可行性。

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