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首页> 外文期刊>Terahertz Science and Technology, IEEE Transactions on >A High-Sensitivity AlGaN/GaN HEMT Terahertz Detector With Integrated Broadband Bow-Tie Antenna
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A High-Sensitivity AlGaN/GaN HEMT Terahertz Detector With Integrated Broadband Bow-Tie Antenna

机译:集成宽带蝴蝶结天线的高灵敏度AlGaN / GaN HEMT太赫兹探测器

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摘要

Many emerging applications in the terahertz (THz) frequency range demand highly sensitive, broadband detectors for room-temperature operation. Field-effect transistors with integrated antennas for THz detection (TeraFETs) have proven to meet these requirements, at the same time offering great potential for scalability, high-speed operation, and functional integrability. In this contribution, we report on an optimized field-effect transistor with integrated broadband bow-tie antenna for THz detection (bow-tie TeraFET) and compare the detector's performance to other state-of-the-art broadband THz detector technologies. Implemented in a recently developed AlGaN/GaN MMIC process, the presented TeraFET shows a more than twice performance improvement compared to previously fabricated AlGaN/GaNHEMT-based TeraFETs. The detector design is the result of detailed modeling of the plasma-wave-based detection principle embedded in a full-device detector model to account for power coupling of the THz radiation to the intrinsic gated FET channel. The model considers parasitic circuit elements as well as the high-frequency impedance of the integrated broadband antenna, and also includes optical losses from a silicon substrate lens. Calibrated characterization measurements have been performed at room temperature between 490 and 645 GHz, where we find values of the optical (total beam power referenced) noise-equivalent power of 25 and 31 pW/ root Hz at 504 and 600 GHz, respectively, in good agreement with simulation results. We then show the broadband detection capability of our AIGaN/GaN detectors in the range from 0.2 to 1.2 THz and compare the TeraFETs' signal-to-noise ratio to that of a Golay cell and a photomixer. Finally, we demonstrate an imaging application in reflection geometry at 504 GHz and determine a dynamic range of >40 dB.
机译:太赫兹(THz)频率范围内的许多新兴应用都需要用于室温操作的高度灵敏的宽带检测器。事实证明,集成了用于THz检测的天线的场效应晶体管(TeraFET)可以满足这些要求,同时具有可扩展性,高速操作和功能集成性的巨大潜力。在此文稿中,我们报告了一种优化的场效应晶体管,该晶体管具有用于THz检测的集成宽带蝶形天线(bow-tie TeraFET),并将检测器的性能与其他最新的宽带THz检测器技术进行了比较。与最近制造的基于AlGaN / GaNHEMT的TeraFET相比,采用最新开发的AlGaN / GaN MMIC工艺实施的TeraFET的性能提高了两倍以上。该探测器的设计是基于对整个设备探测器模型中嵌入的基于等离子波的探测原理进行详细建模的结果,以说明THz辐射与本征门控FET通道的功率耦合。该模型考虑了寄生电路元件以及集成宽带天线的高频阻抗,并且还包括来自硅基板透镜的光损耗。已在490至645 GHz的室温下进行了校准的表征测量,我们发现分别在504 GHz和600 GHz时,光(总光束功率参考)噪声等效功率分别为25和31 pW /根Hz的值。与仿真结果一致。然后,我们展示了我们的AIGaN / GaN检测器的宽带检测能力在0.2至1.2 THz的范围内,并将TeraFET的信噪比与Golay电池和光混合器的信噪比进行了比较。最后,我们演示了在504 GHz反射几何中的成像应用,并确定了> 40 dB的动态范围。

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