Optimal and near-optimal test sequencing algorithms with realistic test models

摘要

In this paper, we first present the formulation and solution of the basic test sequencing problem. We then consider generalized test sequencing problems that incorporate various practical features such as precedence constraints and setup operations for tests, multi-outcome tests, modular diagnosis, and rectification. We develop various AO/sup */ and information heuristic-based algorithms to solve these practical test sequencing problems. We also discuss the issues involved in implementation of the test sequencing algorithms for solving large problems efficiently, and show that our preprocessing techniques result in considerable speed-ups.