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Temperature dependence of photo-hole decay in 4d derived Quantum Well States in monolayer Ag(111) films on Pd(111), Ni(111), Mo(110) and Cu(100)

机译:Pd(111),Ni(111),Mo(110)和Cu(100)上单层Ag(111)薄膜中4d导出的量子阱态中光洞衰变的温度依赖性

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摘要

We present experimental data on the temperature dependence of photo-hole decay obtained by Angle Resolved Photoemission (ARPES) measurements from 4d derived Quantum Well States (QWS) on Ag(111) monolayer films deposited on Pd(111), Ni(111), Mo(110) and Cu(100). We have found a significant increase of the Ag 4d electron-phonon (e-ph) coupling strength with respect to the bulk values. The increase is attributed to different mechanisms that are associated with the interaction of the Ag film with under laying substrate. It is proposed that the main channels that contribute to the increased e-ph coupling originate from the inter-band transitions that involve bulk states of the substrates.
机译:我们提供了通过角度分辨光发射(ARPES)测量获得的光洞衰变的温度依赖性的实验数据,该角度测量是由沉积在Pd(111),Ni(111), Mo(110)和Cu(100)。我们发现Ag 4d电子-声子(e-ph)的耦合强度相对于体积值有显着提高。该增加归因于与Ag膜与下敷衬底的相互作用有关的不同机理。提出了有助于增加e-ph耦合的主要通道源自涉及衬底的体态的带间跃迁。

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  • 来源
    《Surface Science》 |2012年第10期|p.840-845|共6页
  • 作者单位

    Faculty of Electrical Engineering and Computing, University of Zagreb, Unska 3, HR-10000 Zagreb, Croatia,Institut za fiziku, Bijenicka 46, HR-10000 Zagreb. Croatia;

    Institut za fiziku, Bijenicka 46, HR-10000 Zagreb. Croatia;

    Institut za fiziku, Bijenicka 46, HR-10000 Zagreb. Croatia;

    Institut za fiziku, Bijenicka 46, HR-10000 Zagreb. Croatia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    electron-phonon coupling; d-quantum well states; Ag monolayer; ARPES;

    机译:电子-声子耦合;d-量子阱态;Ag单层;ARPES;

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