机译:垂直电场作用下单个InGaN / GaN量子点中量子限制斯塔克效应的实验和理论研究
Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford 0X1 3PU, UK;
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK;
National Centre for III-V Technologies, Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield, S1 3JD, UK;
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK;
Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford 0X1 3PU, UK;
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK;
InGaN; single quantum dot; quantum-confined stark effect; tight-binding model;
机译:横向电场下单个InGaN量子点中的量子限制斯塔克效应
机译:外加电场对掺锌InGaN / GaN量子点中受主态的影响
机译:InGaN / GaN单量子阱中缺陷和压电场的发光研究
机译:单量子井Ingan / GaN LED中量子限制的颗粒效应和偏振场
机译:自组装量子点:对单个和垂直耦合的II型量子点中激子的理论研究。
机译:电场和磁场对锌共混对称InGaN / GaN多量子点中杂质结合能的影响
机译:横向电场下单个InGaN量子点中的量子限制斯塔克效应