机译:载流子溢出和俄歇复合对InGaN基蓝色LED效率下降的影响
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23220, USA;
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23220, USA;
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23220, USA;
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23220, USA;
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23220, USA;
quantum efficiency; efficiency droop; auger recombination; carrier spillover; light emitting diodes;
机译:通过观察光致发光中的热载流子,确定nnp和npp Auger重组是(GaIn)N量子阱中效率下降的重要因素
机译:通过可视化光致发光中的热载流子,确定nnp和npp Auger重组是(Galn)N量子阱中效率下降的重要因素
机译:基于InGaN的蓝色LED的效率下降抑制:实验和数值模型
机译:InGaN基发光二极管中饱和辐射复合速率的效率下降模型及其通过辐射和非辐射载流子寿命测量的验证
机译:研究和优化GaN基发光二极管中的载流子传输,载流子分布和效率下降
机译:理解基于InGaN的发光二极管效率下降的实验方法综述
机译:通过观察光致发光中的热载流子,确定nnp和npp Auger重组是(GaIn)N量子阱中效率下降的重要因素