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The influence of well thickness on the photoluminescence properties of blue-violet light emitting InGaN/GaN multiple quantum wells

机译:阱厚度对发射蓝紫色InGaN / GaN多量子阱的光致发光性能的影响

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AbstractPhotoluminescence (PL) properties of four blue-violet light emitting InGaN/GaN multiple quantum well (MQW) structures with varying well thickness were studied by means of room temperature PL (RTPL) spectra and temperature-dependent PL (TDPL). From the TDPL, two different kinds of dependencies of PL peak energy with increasing temperature are observed, i.e. an S-shape dependence and an inverted V-shape one. Since the In content in MQW structures is nearly identical for four samples, the difference in luminescence properties is mainly attributed to an increase in localization effects with increasing well thickness.HighlightsThe PL dominant peaks of samples A and B undergo an S-shape shift with increasing temperature.While for the samples C and D display an inverted V-shape shift with increasing temperature.The Samples A and B display a declining-then-rising trend of the full width at half maximum (FWHM).The FWHM of the samples C and D display a trend of continuous increase.The differences mentioned above is attributed to an increase in localization effects with increasing well thickness.
机译: 摘要 研究了四种具有不同阱厚度的蓝紫色发光InGaN / GaN多量子阱(MQW)结构的光致发光(PL)特性通过室温PL(RTPL)光谱和与温度相关的PL(TDPL)。从TDPL中,观察到PL峰值能量随温度升高的两种不同的依赖性,即S形依赖性和倒V形依赖性。由于四个样品的MQW结构中的In含量几乎相同,因此发光特性的差异主要归因于定位效应随阱厚度的增加而增加。 < / ce:abstract> 突出显示 样品A和B的PL主峰随温度升高而发生S形位移。 而对于样品C和D,随着温度的升高,它们呈现出倒置的V形位移。 样本A和B显示下降然后上升半高全宽(FWHM)的趋势。 样本C和D的FWHM显示出持续增加的趋势。 上述差异归因于定位效果随井壁厚度的增加而增加。

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