MOKE Magnetometer Studies of Evaporated Ni and Ni/Cu Thin Films onto Different Substrates

摘要

The Magneto-Optic Kerr Effect (MOKE) technique has been used to investigate the magnetic properties of Ni thin films, with thickness t ranging from 9 to 163 nm, evaporated onto several substrates (glass, Si (111), mica and Cu) with and without an evaporated Cu underlayer. The MOKE observations were correlated with the surface morphology inferred from Scanning Electron Microscope images and with the structural properties (grain size and strain). Some interesting behaviors of the coercive field (with values in the 2 to 151 Oe range), the squareness (between 0.1 and 0.91) and the saturation field (25-320 Oe) are observed as a function of t, the substrate and the Cu underlayer. A thickness-dependent stress-induced anisotropy is found in these films. The differences between the present MOKE results and the ones obtained from the Vibrating Sample magnetometer (VSM) are highlighted. The former describe the surface magnetism of these systems, while the latter are attributed to the whole volume of the sample.