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A 4 × 4 8T-SRAM array with single-ended read and differential write scheme for low voltage applications

机译:具有4×4 8T-SRAM阵列,具有用于低压应用的单端读取和差分写方案

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摘要

In ultra-low-power applications, the design of power-efficient static random access memory (SRAM) is a major concern as it plays a significant part in leakage due to its higher density. In this paper, we have designed a power-efficient SRAM array that efficiently utilizes our SRAM cell for low-power and reliable memory applications. The proposed SRAM array is designed with an optimized 8T SRAM cell with minimum leakage and improved stability. The cell designed with 22 nm CMOS technology uses a stacking effect to further enhance leakage reduction and transmission gate as an access transistor to obtain better stability. Peripheral circuitry like address decoder, write driver, pre-charge, and sense amplifier are designed with optimum transistor sizing to get superior results in terms of area occupied and power consumption. The read and write access time for the cell is found to be 12 ps and 10 ps respectively. In line with the 22 nm technology node, the power is calculated for the array as 0.42 mu W.
机译:在超低功率应用中,节能静态随机存取存储器(SRAM)的设计是由于其较高密度引起的泄漏效率的主要问题。在本文中,我们设计了一种功能高效的SRAM阵列,可有效利用我们的SRAM单元进行低功耗和可靠的存储器应用。所提出的SRAM阵列采用优化的8T SRAM单元设计,具有最小泄漏和改善的稳定性。用22nm CMOS技术设计的电池使用堆叠效果来进一步增强泄漏减少和传输栅极作为接入晶体管,以获得更好的稳定性。外围电路如地址解码器,写驱动器,预充电和检测放大器设计有最佳晶体管尺寸,以获得占用和功耗的面积卓越的结果。将发现单元格的读取和写入访问时间分别为12 ps和10 ps。符合22 nm技术节点,为阵列计算电源为0.42μW。

著录项

  • 来源
    《Semiconductor science and technology》 |2021年第6期|065013.1-065013.9|共9页
  • 作者单位

    Manipal Univ Jaipur Dept Elect & Commun Engn Jaipur 303007 Rajasthan India;

    Manipal Univ Jaipur Dept Elect & Commun Engn Jaipur 303007 Rajasthan India;

    Manipal Univ Jaipur Dept Elect & Commun Engn Jaipur 303007 Rajasthan India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    SRAM; leakage power; stacking effect; noise margin;

    机译:SRAM;泄漏功率;堆叠效果;噪声裕度;

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