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A differential data aware power-supplied (D2AP) 8T SRAM cell with expanded write/read stabilities for lower VDDmin applications

机译:差分数据感知电源供应(D 2 AP)8T SRAM单元,具有扩展的较低VDDMIN应用程序的写入/读取稳定性

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A differential data aware power supplied (D2AP) 8T-SRAM cell has been proposed to address the stability trade-off-issues between write and half-select accesses that still remain in the conventional 8T and 6T cells. Powered by its bitline pair, this 8T cell applies differential data-aware-supplied voltages to its cross-coupled inverters to enlarge both stability margins for write and half-select accesses. A boosted bitline scheme also improves read cell current. Two 45nm 39Kb SRAM macros, D2AP (this work) and conventional 8T were fabricated on the same testchip. The measured VDDmin for D2AP-8T is 240mV lower than that of the conventional 8T.
机译:已经提出了提供的差分数据感知电源(D 2 AP)8T-SRAM单元以解决仍然保留在传统8T和6T中的写入和半选择访问之间的稳定性折衷问题细胞。由其位线对提供动力,该8T单元将差分数据感知提供的电压应用于其交叉耦合的逆变器,以放大写入和半选择访问的稳定性边距。增强的位线方案还提高了读取的单元电流。在相同的测试芯片上制造了两种45nm 39KB SRAM宏,D 2 AP(此工作)和常规8T。用于D 2 AP-8T的测量VDDMIN比传统8T的D 240mV为240mV。

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