首页> 外文期刊>Science >Quantization of Multiparticle Auger Rates in Semiconductor Quantum Dots
【24h】

Quantization of Multiparticle Auger Rates in Semiconductor Quantum Dots

机译:半导体量子点中多粒子俄歇速率的量化

获取原文
获取原文并翻译 | 示例
       

摘要

We have resolved single-exponential relaxation dynamics of the 2-, 3-, and 4-electron-hole pair states in nearly monodisperse cadmium selenide quantum dots with radii ranging from 1 to 4 nanometers. Comparison of the discrete relaxation constants measured for different multiple-pair states indicates that the carrier decay rate is cubic in carrier concentration, which is characteristic of an Auger process. We observe that in the quantum-confined regime, the Auger constant is strongly size-dependent and decreases with decreasing the quantum dot size as the radius cubed.
机译:我们已经解决了半径为1至4纳米的近单分散硒化镉量子点中2、3和4电子空穴对态的单指数弛豫动力学。对不同的多对态所测得的离散弛豫常数的比较表明,载流子的衰减速率在载流子浓度上是立方的,这是俄歇过程的特征。我们观察到,在量子受限状态下,俄歇常数与尺寸密切相关,并且随着半径的立方化而随着量子点尺寸的减小而减小。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号