首页> 外文期刊>IEEE Transactions on Plasma Science >Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a Faraday cup operating in the secondary electron emission mode
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Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a Faraday cup operating in the secondary electron emission mode

机译:在二次电子发射模式下运行的法拉第杯对低能等离子体聚焦装置中产生的氮离子束的分析

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摘要

The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N/sub 2/ pressure is reported. A Faraday cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of /spl ap/50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work.
机译:报告了在N / sub 2 /压力为0.4 Torr的Mather型等离子体聚焦装置中产生的快速氮粒子的能量分布和通量。使用以二次电子发射模式操作的法拉第杯。为了确定束粒子的总数,考虑了离子的多次散射。可以将离子能量记录到较低的动能阈值/ spl ap / 50 keV,该阈值比使用汤姆森光谱仪在以前的工作中获得的值低得多。

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