首页> 美国卫生研究院文献>other >Low-Energy Plasma Focus Device as an Electron Beam Source
【2h】

Low-Energy Plasma Focus Device as an Electron Beam Source

机译:低能等离子体聚焦装置作为电子束源

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

A low-energy plasma focus device was used as an electron beam source. A technique was developed to simultaneously measure the electron beam intensity and energy. The system was operated in Argon filling at an optimum pressure of 1.7 mbar. A Faraday cup was used together with an array of filtered PIN diodes. The beam-target X-rays were registered through X-ray spectrometry. Copper and lead line radiations were registered upon usage as targets. The maximum electron beam charge and density were estimated to be 0.31 μC and 13.5 × 1016/m3, respectively. The average energy of the electron beam was 500 keV. The high flux of the electron beam can be potentially applicable in material sciences.
机译:低能等离子体聚焦装置用作电子束源。开发了一种可以同时测量电子束强度和能量的技术。该系统在1.7 mbar的最佳压力下以氩气充注操作。法拉第杯与一系列过滤后的PIN二极管一起使用。束目标X射线通过X射线光谱法记录。铜和铅线辐射在使用时被记录为目标。最大电子束电荷和密度估计分别为0.31μC和13.5×10 16 / m 3 。电子束的平均能量为500 keV。电子束的高通量可能会在材料科学中应用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号