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Imperative function of electron beams in low-energy plasma focus device

机译:电子束在低能等离子体聚焦装置中的功能

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A 2.2 kJ plasma focus device was analysed as an electron beam and an X-ray source that operates with argon gas refilled at a specific pressure. Time-resolved X-ray signals were observed using an array of PIN diode detectors, and the electron beam energy was detected using a scintillator-assisted photomultiplier tube. The resultant X-rays were investigated by plasma focus discharge for pressures ranging from 1.5 mbar to 2.0 mbar. This range corresponded to the significant values of X-ray yields and electron beam energies from the argon plasma. The electron temperature of argon plasma at an optimum pressure range was achieved by an indirect method using five-channel BPX65 PIN diodes of aluminum foils with different thicknesses. X-ray yield, electron beam energy, and electron temperature of argon plasma were achieved at 1.5a€“2.0 mbar because of the strong bombardment of the energetic electron beam.
机译:分析了一个2.2 kJ的等离子体聚焦装置,将其作为电子束和X射线源进行分析,该X射线源使用在特定压力下重新填充的氩气运行。使用PIN二极管检测器阵列观察时间分辨的X射线信号,并使用闪烁器辅助的光电倍增管检测电子束能量。通过等离子体聚焦放电在1.5 mbar至2.0 mbar的压力范围内研究了所得的X射线。该范围对应于来自氩等离子体的X射线产率和电子束能量的显着值。使用具有不同厚度的铝箔的五通道BPX65 PIN二极管,通过间接方法获得了在最佳压力范围内的氩等离子体的电子温度。由于高能电子束的强烈轰击,使得氩气等离子体的X射线产率,电子束能量和电子温度达到1.5a“ 2.0 mbar”。

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