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Plasma Facing Component Characterization and Correlation With Plasma Conditions in Lithium Tokamak Experiment-β

机译:血浆面向锂托卡马克实验 - β中血浆条件的组分表征和相关性

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Lithium coatings in the Lithium Tokamak eXperiment (LTX) led to flat temperature profiles. The flat temperature profiles were observed along with a hot, low density edge, implying a broad, collisionless scrape-off layer (SOL). Additionally, in vacuo X-ray photoelectron spectroscopy (XPS) measurements established that lithium coatings evaporatively deposited onto high-Z plasma facing components (PFCs) became oxidized while retaining the ability to achieve good plasma performance long after lithium was applied to the PFCs. Longstanding theory predicted flat temperature profiles with low recycling walls, which was presumed to be due to hydrogen binding with elemental lithium to form lithium hydride. The presence of oxidized lithium, however, raised questions regarding the exact mechanism of hydrogen retention in LTX. To investigate these questions, the upgraded facility LTX- includes a new sample exposure probe (SEP) for more detailed in vacuo analysis of PFC samples. The SEP is equipped with a vacuum suitcase capable of transporting samples representative of the LTX-outer midplane PFCs to a stand-alone XPS system while maintaining pressures lower than the LTX-base vacuum to limit the contamination between sample exposure and analysis. The low-energy resolution XPS system used in past experiments could only enable the determination of elemental percentages on the PFC sample surfaces. Because the new XPS system has higher energy resolution, it is more direct to assign chemical compounds to the measured binding energies. This capability has been confirmed by comparing XPS data from PFC test samples with measurements using a commercial high-resolution XPS system. Quartz crystal microbalances (QCMs) were used to quantify the thickness of the deposited lithium on the LTX- PFCs. This article describes the application of the SEP to characterize the PFC surfaces using XPS and their relationship to plasma conditions.
机译:锂涂层在锂托卡马克实验(LTX)中导致平坦的温度曲线。观察到平坦的温度曲线以及热,低密度边缘,暗示宽,肌肉刮擦层(溶胶)。另外,在真空X射线光电子体光谱(XPS)测量中,确定蒸发蒸发到高Z等离子体上的锂涂层蒸发到高Z等离子体上(PFC),同时保留锂在锂施加到PFC后长度达到良好的等离子体性能的能力。长期理论预测具有低回收壁的平坦温度曲线,这被推测为氢结合与元素锂形成氢化锂。然而,存在氧化锂的存在提出了关于LTX氢保留的确切机制的问题。为了调查这些问题,升级的设施LTX-包括新的样品暴露探针(SEP),以便在PFC样品的真空分析中更详细地进行。 SEP配备有真空手提箱,其能够将代表LTX外中间PFC的样品输送到独立的XPS系统,同时保持低于LTX基础真空的压力,以限制样品暴露和分析之间的污染。过去实验中使用的低能量分辨率XPS系统只能能够确定PFC样品表面上的元素百分比。由于新的XPS系统具有更高的能量分辨率,因此将化学化合物分配给测量的结合能量更为直接。通过使用商业高分辨率XPS系统比较来自PFC测试样本的XPS数据来确认这种能力。石英晶体微稳定(QCMS)用于量化LTX-PFC上沉积锂的厚度。本文介绍了SEP的应用,以使用XPS表征PFC表面及其与等离子体条件的关系。

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