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Transport Properties of a 3D Topological Insulator based on a Strained High-Mobility HgTe Film

机译:基于应变高迁移率HgTe膜的3D拓扑绝缘子的传输特性

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摘要

We investigate the magnetotransport properties of strained 80 nm thick HgTe layers featuring a high mobility of μ ~ 4 × 10~5 cm~2/V • s. By means of a top gate, the Fermi energy is tuned from the valence band through the Dirac-type surface states into the conduction band. Magnetotransport measurements allow us to disentangle the different contributions of conduction band electrons, holes, and Dirac electrons to the conductivity. The results are in line with previous claims that strained HgTe is a topological insulator with a bulk gap of ≈ 15 meV and gapless surface states.
机译:我们研究了应变为80 nm厚的HgTe层的磁输运性质,该层的迁移率为μ〜4×10〜5 cm〜2 / V•s。借助于顶栅,费米能量从价带通过狄拉克型表面态调谐到导带。磁传输测量使我们能够解开导带电子,空穴和狄拉克电子对电导率的不同贡献。结果与先前的说法相符,应变HgTe是一种拓扑绝缘体,具有约15 meV的体隙和无间隙的表面态。

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