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机译:基于应变高迁移率HgTe膜的3D拓扑绝缘子的传输特性
A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia,Novosibirsk State University, Novosibirsk 630090, Russia;
A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia,Novosibirsk State University, Novosibirsk 630090, Russia;
A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia;
A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia;
A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia;
Experimental and Applied Physics, University of Regensburg, D-93040 Regensburg, Germany;
surface conductivity and carrier phenomena; quantum transport; surface states, band structure, electron density of states; quantum hall effects;
机译:基于紧张HGTE膜的高迁移率3D拓扑绝缘子的太赫兹光致抗蚀性
机译:基于应变高迁移率HgTe膜的三维拓扑绝缘子表面状态中的回旋共振辅助光电流
机译:基于高迁移率HgTe薄膜的三维拓扑绝缘体中的弱抗局部化
机译:基于应变高迁移率HgTe膜的3D拓扑绝缘子的表面状态THz光谱
机译:3D拓扑绝缘体的传输特性。
机译:SmNiO3应变薄膜的金属-绝缘体转变:结构电和光学性质
机译:基于应变高迁移率HgTe膜的3D拓扑绝缘子的传输特性