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Suppression of current collapse in AlGaN/GaN MISHFET with carbon-doped GaN/undoped GaN multi-layered buffer structure

机译:用碳掺杂的GaN /未掺杂的GaN多层缓冲结构抑制AlGaN / GaN MISHFET中的电流崩溃

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摘要

We present a new semi-insulating carbon-doped GaN/undoped GaN multi-layered buffer structure for AlGaN/GaN hetero-junction field effect transistors, which drastically suppresses current collapse in GaN MISHFET with improving the on-current performance of the device but without degrading the breakdown characteristic. It is believed that spatial compensation between the multi-layered GaN layers not only makes the multi-layered buffer layer very highly resistive, but also prevents the electrons from the 2DEG channel from being captured into deep traps in the buffer layer, which maintains high-high breakdown characteristic and leads to great suppression of current collapse in AlGaN/GaN-based transistors, respectively.
机译:我们提出了一种用于AlGaN / GaN异质结场效应晶体管的新型半绝缘碳掺杂GaN /未掺杂GaN多层缓冲结构,可大幅度抑制GaN MISHFET中的电流崩塌,同时改善了器件的导通电流性能,但没有降低击穿特性。可以相信,多层GaN层之间的空间补偿不仅使多层缓冲层具有很高的电阻,而且还防止了来自2DEG通道的电子被捕获到缓冲层中的深陷阱中,从而保持了高高击穿特性并分别大大抑制了基于AlGaN / GaN的晶体管的电流崩溃。

著录项

  • 来源
    《Physica status solidi》 |2015年第5期|1116-1121|共6页
  • 作者单位

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

    School of Electronics Engineering, Kyungpook National University, Daehak-ro 80, Buk-gu, Daegu 702-701, Republic of Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    AlGaN; GaN; doping; current collapse; MOCVD; heterostructure field-effect transistors;

    机译:氮化铝镓;氮化镓;掺杂当前崩溃;MOCVD;异质结构场效应晶体管;
  • 入库时间 2022-08-18 03:11:19

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