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Open-Circuit Voltage Improvement of InAs/GaAs Quantum-Dot Solar Cells Using Reduced InAs Coverage

机译:使用减小的InAs覆盖率来提高InAs / GaAs量子点太阳能电池的开路电压

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摘要

Ten-, 20-, and 40-layer InAs/GaAs quantum-dot (QD)-embedded superlattice solar cells were compared with a baseline GaAs p-i-n solar cell. Proper strain balancing and a reduction of InAs coverage value in the superlattice region of the QD embedded devices enabled the systematic increase in short-circuit current density with QD layers (0.02-mA/cm$^2$/QD layer) with minimal open-circuit voltage loss (∼50 mV). The improvement in voltage was found to be due to a reduced nonradiative recombination resulting from a reduced density of larger defective QDs and effective strain management. The 40-layer device exceeded the baseline GaAs cell by 0.5% absolute efficiency improving efficiency relative to the baseline by 3.6%.
机译:将嵌入10、20和40层InAs / GaAs量子点(QD)的超晶格太阳能电池与基线GaAs p-i-n太阳能电池进行了比较。在QD嵌入式设备的超晶格区域中适当的应变平衡和InAs覆盖值的减小使QD层(0.02-mA / cm $ ^ 2 $ / QD层)的短路电流密度有系统地增加,而开路最小。电路电压损失(〜50 mV)。发现电压的提高归因于由于较大缺陷QD的密度降低和有效应变管理而导致的非辐射重组减少。 40层器件的绝对效率超出了基线GaAs电池0.5%,相对于基线提高了3.6%。

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