首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >The beam blanking system for microlithography at Lund Nuclear Microprobe
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The beam blanking system for microlithography at Lund Nuclear Microprobe

机译:隆德核微探针公司用于微光刻的光束消隐系统

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A new beam blanking system was installed at the Lund Nuclear Microprobe and employed in proton beam lithography (PBL) for polymer micro structures fabrication. The blanker consists of two parallel plates connected to a high voltage generator. Measurement of the beam blanking time on a sample was performed by means of the standard PIXE system. The beam is blanked and returns to a sample within 200 ns. The blanking system is designed for the new sub-micrometer beamline under installation in the accelerator laboratory. A number of pilot MeV ion beam lithography experiments were performed to illustrate the possibility to use the blanking system in combination with the existing data acquisition and scanning system. A 2.5 MeV proton beam was used to irradiate 50μm SU-8 negative resist. The blanker was shown to be a necessary part of the lithography system. It enables blanking between each pixel and hence fabrication of various patterns down to a single pixel. The blanker has significantly simplified beam control and enhanced process time and spatial resolution. Three-dimensional micro-structures with 20:1 aspect ratio were fabricated.
机译:在隆德核微探针处安装了新的射束消隐系统,并将其用于质子束光刻(PBL)中以制造聚合物微结构。落料器由连接到高压发生器的两个平行板组成。借助于标准的PIXE系统对样品上的光束消隐时间进行测量。光束被消隐,并在200 ns内返回到样本。消隐系统是为加速器实验室中正在安装的新的亚微米光束线设计的。进行了许多中试MeV离子束光刻实验,以说明将消隐系统与现有数据采集和扫描系统结合使用的可能性。使用2.5 MeV质子束辐照50μmSU-8负性抗蚀剂。消隐器被证明是光刻系统的必要部分。它使每个像素之间可以消隐,从而可以制作出各种图案,直至单个像素。消隐器大大简化了光束控制,并提高了处理时间和空间分辨率。制作了长宽比为20:1的三维微结构。

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