机译:60 meV质子辐射诱导的非线性光耦合器的降解
Xiangtan Univ Sch Mat Sci & Engn Xiangtan 411105 Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Xiangtan Univ Sch Mat Sci & Engn Xiangtan 411105 Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Northwest Inst Nucl Technol State Key Lab Intense Pulsed Irradiat Simulat & E Xian 710024 Shaanxi Peoples R China;
Optocoupler; Proton radiation; Displacement damage; Degradation; Current transfer ratio (CTR);
机译:60 MeV质子辐照引起的非线性光电耦合器退化
机译:比较4 MeV质子和Co-60γ辐照引起的N沟道MOSFET的电特性下降
机译:在60 MeV质子辐照下90 nm CMOS晶体管的栅氧化降解的偏差依赖性。
机译:在60meV质子辐射下的90nm CMOS晶体管的栅极氧化物劣化的偏置依赖性
机译:通过深紫外线,X射线,电子束和质子束辐照辐射诱导的PMMA改性和降解来增强聚甲基丙烯酸甲酯的敏感性。
机译:能量为1 keV至10 MeV的中子辐照从聚乙烯转化器出来的质子的特性
机译:153用细胞遗传学和分子学方法评估60 MeV质子辐照引起的DNA损伤