NEURAL NETWORK BASED APPROACH TO THE EVALUATION OF DEGRADATION LIFETIME

摘要

The applicability of neural networks of the evaluation of the lifetime of semiconductor devices is demonstrated. The neural network based method can be used as a general tool for modeling. The commonly used main-accelerating- parameter models could be obtained by the neural net reducing. The neural net- work based method is attractive also due tot he neural net ability to process" noisy" data. The method should find wide applications in degradation modeling.