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Transmission Property Of Flip Chip Package With Adhesive Interconnection For Rf Applications

机译:射频互连具有粘性互连的倒装芯片封装的传输特性

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摘要

The radio frequency (RF) and high frequency performance of the flip chip interconnects with anisotropic conductive film (ACF) and non-conductive film (NCF) was investigated and compared by measuring the scattering parameters (S-parameters) of the flip chip modules. Low cost electroless-Ni immersion-Au (ENIG) plating was employed to form the bumps for the adhesive bonding. To compare the accurate intrinsic RF performance of the ACF and NCF interconnect without lossy effect of chip and substrate, a de-embedding modeling algorithm was employed. The effects of two chip materials (Si and GaAs), the height of ENIG bumps, and the metal pattern gap between the signal line and ground plane in the copla-nar waveguide (CPW) on the RF performance of the flip chip module were also investigated. The transmission properties of the GaAs were markedly improved on those of the Si chip, which was not suitable for the measurement of the S-parameters of the flip chip interconnect. Extracted impedance parameters showed that the RF performance of the flip chip interconnect with NCF was slightly better than that of the interconnect with ACF, mainly due to the capacitive component between the bump and substrate and self inductance of the conductive particle surface in the ACF interconnect.
机译:通过测量倒装芯片模块的散射参数(S参数),研究并比较了倒装芯片与各向异性导电膜(ACF)和非导电膜(NCF)互连的射频(RF)和高频性能。采用低成本的化学镀镍沉金(ENIG)来形成用于粘接的凸点。为了比较ACF和NCF互连的准确固有RF性能,而没有芯片和基板的损耗影响,采用了一种去嵌入建模算法。两种芯片材料(Si和GaAs),ENIG凸块的高度以及copla-nar波导(CPW)中信号线和接地层之间的金属图案间隙对倒装芯片模块RF性能的影响也调查。 GaAs的传输性能比Si芯片的传输性能显着提高,这不适用于倒装芯片互连的S参数的测量。提取的阻抗参数表明,使用NCF的倒装芯片互连的RF性能略好于使用ACF的互连的RF性能,这主要归因于ACF互连中凸块和基板之间的电容成分以及导电粒子表面的自感。

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