...
首页> 外文期刊>Journal of Vacuum Science & Technology >5 kV multielectron beam lithography: MAPPER tool and resist process characterization
【24h】

5 kV multielectron beam lithography: MAPPER tool and resist process characterization

机译:5 kV多电子束光刻:MAPPER工具和抗蚀剂工艺表征

获取原文
获取原文并翻译 | 示例
           

摘要

A multielectron beam tool from MAPPER lithography was installed in LETI premises in July 2009. It is based on low voltage lithography. In order to prepare acceptance tests, a preliminary study was carried out with a Leica VB6 HR at 5 kV in order to define 5 kV suitable resist processes. Results obtained at higher voltages are compared, since this tool has the capability to accelerate electrons up to 50 kV. The dependence of the deposition of backscattered energy on voltage is also evaluated. The 5 kV results are compared with those obtained on the MAPPER tool. Its spot size is measured, while a 32 nm half pitch resolution is reached.
机译:MAPPER光刻技术的多电子束工具已于2009年7月安装在LETI场所。该工具基于低压光刻技术。为了准备验收测试,对Leica VB6 HR在5 kV下进行了初步研究,以定义5 kV合适的抗蚀剂工艺。比较了在较高电压下获得的结果,因为该工具具有将电子加速到50 kV的能力。还评估了反向散射能量沉积对电压的依赖性。将5 kV的结果与MAPPER工具获得的结果进行比较。测量其光点尺寸,同时达到32 nm的半节距分辨率。

著录项

  • 来源
    《Journal of Vacuum Science & Technology》 |2010年第6期|p.C6C14-C6C20|共7页
  • 作者单位

    CEA Grenoble-MINATEC, 17 rue des Martyrs, F38054 Grenoble, France;

    CEA Grenoble-MINATEC, 17 rue des Martyrs, F38054 Grenoble, France;

    CEA Grenoble-MINATEC, 17 rue des Martyrs, F38054 Grenoble, France;

    CEA Grenoble-MINATEC, 17 rue des Martyrs, F38054 Grenoble, France;

    MAPPER Lithography B.V., Computerlaan 15, 2628 XK Delft, The Netherlands;

    MAPPER Lithography B.V., Computerlaan 15, 2628 XK Delft, The Netherlands;

    CEA Grenoble-MINATEC, 17 rue des Martyrs, F38054 Grenoble, France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号