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首页> 外文期刊>Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures >Fabrication of a surface acoustic wave-based correlator using step-and-flash imprint lithography
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Fabrication of a surface acoustic wave-based correlator using step-and-flash imprint lithography

机译:使用步进闪光压印光刻技术制造基于声表面波的相关器

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We report the surface acoustic wave (SAW) correlator devices fabricated using nanoimprint lithography. Using step-and-flash imprint lithography (S-FIL),.we produced SAW correlator devices on 100 mm diameter z-cut LiNbO_3 devices and an aluminum metal etch process. On the same chip layout, we fabricated SAW filters and compared both the filters and correlators to similar devices fabricated using electron-beam lithography (EBL). Both S-FTL- and EBL-patterned correlators and SAW filters were analyzed using a bit-error rate tester to generate the signal and a parametric signal analyzer to evaluate the output. The NIL filters had an average center frequency of 2.38 GHz with a standard deviation of 10 MHz. The measured insertion loss averaged -31 dB. In comparison, SAW filters fabricated using EBL exhibited a center frequency of 2.39 GHz and a standard deviation of 100 kHz. Based on our preliminary results, we believe that S-FIL is an efficient and entirely viable fabrication method to produce quality SAW filters and correlators.
机译:我们报告使用纳米压印光刻技术制造的表面声波(SAW)相关器设备。使用步进闪光压印光刻(S-FIL),我们在直径为100 mm的z切割LiNbO_3器件和铝金属蚀刻工艺上生产了SAW相关器器件。在相同的芯片布局上,我们制造了SAW滤波器,并将滤波器和相关器与使用电子束光刻(EBL)制造的类似器件进行了比较。使用误码率测试仪生成信号,并使用参数信号分析仪评估输出,对S-FTL和EBL模式的相关器以及SAW滤波器进行了分析。 NIL滤波器的平均中心频率为2.38 GHz,标准偏差为10 MHz。测得的插入损耗平均为-31 dB。相比之下,使用EBL制造的SAW滤波器的中心频率为2.39 GHz,标准偏差为100 kHz。根据我们的初步结果,我们相信S-FIL是生产高质量SAW滤波器和相关器的一种有效且完全可行的制造方法。

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