首页> 外国专利> Imprint lithography equipment with self-alignment function of contacting surface and method of imprinting lithography for using the same

Imprint lithography equipment with self-alignment function of contacting surface and method of imprinting lithography for using the same

机译:具有接触表面自对准功能的压印光刻设备及其使用的压印光刻方法

摘要

The present invention relates to a self-aligned imprint lithography apparatus and an imprint lithography method using the same. More particularly, in an imprint lithography process, when a stamp and a substrate fixed to a substrate chuck are brought into contact with each other, Alignment of the substrate so that the position of the substrate can be aligned parallel to the contact surface with the stamp, and an imprint lithography method using the self-aligned imprint lithography apparatus.
机译:自对准压印光刻设备和使用其的压印光刻方法技术领域本发明涉及自对准压印光刻设备和使用其的压印光刻方法。更具体地,在压印光刻工艺中,当压模和固定至基板卡盘的基板彼此接触时,基板的对准使得基板的位置可以平行于与压模的接触表面对准。以及使用自对准压印光刻设备的压印光刻方法。

著录项

  • 公开/公告号KR101471185B1

    专利类型

  • 公开/公告日2014-12-11

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20130040151

  • 发明设计人 최기봉;이재종;김기홍;임형준;

    申请日2013-04-11

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 15:01:06

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