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首页> 外文期刊>Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures >Effects of plasma conditions on properties of ZnO films grown by plasma-assisted molecular beam epitaxy
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Effects of plasma conditions on properties of ZnO films grown by plasma-assisted molecular beam epitaxy

机译:等离子体条件对等离子体辅助分子束外延生长ZnO薄膜性能的影响

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The influence of rf power and aperture plate configuration on the growth of ZnO thin films using plasma-assisted molecular beam epitaxy was investigated. It was found that by changing the aperture plate geometry from 276 to 25 holes, an increase of growth rate was observed, suggesting that the latter is more efficient for ZnO growth. The structural, electrical, and optical properties were also improved as measured by in situ electron diffraction, single field Hall, effect, and photoluminescence. A background carrier concentration of 1 x 10(18) cm(-3) and a mobility of 52 cm(2)/V s were measured, and a room-temperature band edge peak 200 times the defect band intensity was observed. Optical emission spectroscopy shows significantly different behavior in plasma generated using the two plates and suggests that more than increased atomic oxygen production is occurring. (c) 2006 American Vacuum Society.
机译:研究了射频功率和孔板配置对等离子辅助分子束外延生长ZnO薄膜的影响。已经发现,通过将孔板的几何形状从276个孔更改为25个孔,可以观察到生长速率的增加,这表明后者对于ZnO的生长更为有效。通过原位电子衍射,单场霍尔,效应和光致发光测量,还改善了结构,电学和光学性质。测量的背景载流子浓度为1 x 10(18)cm(-3),迁移率为52 cm(2)/ V s,观察到室温带边缘峰是缺陷带强度的200倍。光学发射光谱学表明,使用这两个板所产生的等离子体具有显着不同的行为,并表明发生的原子氧增加不止于此。 (c)2006年美国真空学会。

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