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首页> 外文期刊>Journal of materials science >Effect of strain rate on interfacial fracture behaviors of Sn-58Bi/Cu solder joints
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Effect of strain rate on interfacial fracture behaviors of Sn-58Bi/Cu solder joints

机译:应变速率对Sn-58Bi / Cu焊点界面断裂行为的影响

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摘要

The interfacial reactions and mechanical properties of Sn-58Bi/Cu solder joints reflowed at different temperatures ranging from 180 to 220 ℃ for constant time of 10 min were investigated with various strain rates. Only a continuous Cu_6Sn_5 intermetallic compound (IMC) layer was formed at the interface between the Sn-58Bi solder and the Cu substrate during reflow. The equivalent thickness of the Cu_6Sn_5 layer increased with increasing reflow temperature, and the relationship between Cu_6Sn_5 layer equivalent thickness (X) and reflow temperature (T) is obtained by using method of linear regression and presented as X = 0.01 × T + 0.187. For the tensile property, the tensile strength of solder joint gradually decreased as the reflow temperature it increased, whereas it increased with increasing strain rate. Moreover, the fracture behavior of Sn-58Bi/Cu solder joint indicated the ductile fracture with low strain rate (5 × 10~(-4) and 1 × 10~(-3) s~(-1)), while toward brittle fracture with high strain rate (2 × 10~(-3) and 1 × 10~(-2) s~(-1)). The strain rate sensitivities of the solder joints fractured with various modes were also investigated, and it is found that the tensile strength of the solder is more sensitive to the strain rate than that of the IMC layer.
机译:以不同的应变速率研究了Sn-58Bi / Cu焊点在180〜220℃不同温度下回流10min的界面反应和力学性能。在回流期间,仅连续的Cu_6Sn_5金属间化合物(IMC)层形成在Sn-58Bi焊料和Cu衬底之间的界面上。 Cu_6Sn_5层的当量厚度随回流温度的升高而增加,采用线性回归方法获得Cu_6Sn_5层的当量厚度(X)与回流温度(T)之间的关系,并表示为X = 0.01×T + 0.187。对于拉伸性能,焊点的拉伸强度随着回流温度的升高而逐渐降低,而随着应变率的增加而增加。而且,Sn-58Bi / Cu焊点的断裂行为表明其塑性应变率低(5×10〜(-4)和1×10〜(-3)s〜(-1)),而易碎。高应变率(2×10〜(-3)和1×10〜(-2)s〜(-1))的骨折。还研究了以各种方式断裂的焊点的应变率敏感性,并且发现焊料的拉伸强度比IMC层对应变率更敏感。

著录项

  • 来源
    《Journal of materials science》 |2014年第1期|57-64|共8页
  • 作者单位

    School of Mechanical Electrical Engineering, Nanchang University, Nanchang 330031, China;

    School of Mechanical Electrical Engineering, Nanchang University, Nanchang 330031, China;

    School of Mechanical Electrical Engineering, Nanchang University, Nanchang 330031, China;

    School of Mechanical Electrical Engineering, Nanchang University, Nanchang 330031, China;

    School of Materials Science and Engineering, Nanchang University, Nanchang 330031, China;

    China Electronics Technology Group Corporation No. 38 Research Institute, Hefei 230088, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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