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Fracture of Underfilled and Edge-Bonded BGA-PCB Assemblies: Effects of Joint Geometry, Strain Rate and Stiffness

机译:底部填充和边缘结合的BGA-PCB组件的断裂:接头几何形状,应变率和刚度的影响

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摘要

The reliability of the solder joints connecting microelectronic components to printed circuit boards (PCBs) is a serious concern in the design of many electronic devices. The focus of the present research was the fracture performance of component-solder-PCB assemblies with and without underfill adhesives under bending loading conditions.;Fracture tests of copper--solder--copper double-cantilever-beam (DCB) specimens with a single continuous solder layer showed that for joints shorter than a characteristic length the fracture load increased with increasing solder joint length. Also, the fracture tests of DCBs with two discrete solder joints showed the strength was maximum at an optimal joint spacing. An analytical solution was developed for the characteristic length of mode I DCB specimens with a single continuous solder layer as well as the optimal spacing of double-joint DCBs, taking into account the mechanical properties and dimensions of the substrates and solder.;Fracture experiments with underfilled ball grid array (BGA)- PCB specimens in a DCB configuration showed that the specimens always failed in the PCB. The strength of the underfilled BGAs was solely a function of the fillet size, and independent of the underfill thermal and mechanical properties.;Edge-bonding is a less expensive alternative to underfilling, in which only the edges or corners of the component are bonded to the PCB using a viscous adhesive. Edge-bonded and underfilled specimens with fillets of the same size and shape tested using DCB specimens failed at the same load, because the stress distribution in the PCB near the PCB-fillet interface was only a function of the adhesive fillet size and shape, and independent of the extent of the adhesive layer between the PCB and the BGA.;Finally, a cohesive zone model (CZM) was developed to predict the PCB delamination bending loads in underfilled BGA-PCB assemblies. The cohesive parameters were obtained from fracture tests of bending test specimens consisting of PCB substrates bonded with the underfill adhesive. The model provided relatively accurate predictions of the failure mode and fracture load of the underfilled BGA-PCB assemblies for a range of PCB stiffnesses, adhesive fillet sizes, and strain rates.
机译:将微电子元件连接到印刷电路板(PCB)的焊点的可靠性是许多电子设备设计中的一个严重问题。本研究的重点是带有和不带有底部填充胶的元件-焊料-PCB组件在弯曲载荷条件下的断裂性能。;单根铜-焊料-铜双悬臂梁(DCB)试样的断裂试验连续焊料层显示,对于短于特征长度的接缝,断裂载荷随着焊缝长度的增加而增加。另外,具有两个离散焊点的DCB的断裂试验表明,在最佳焊点间距下,强度最大。考虑到基材和焊料的机械性能和尺寸,针对具有单个连续焊料层的I型DCB样品的特征长度以及双接头DCB的最佳间距,开发了一种分析解决方案。底部填充的球栅阵列(BGA)-DCB配置中的PCB样品显示,样品在PCB中始终会失效。底部填充BGA的强度仅取决于圆角尺寸,而与底部填充的热和机械性能无关。边缘粘合是底部填充的一种较便宜的替代方法,在该方法中,仅将组件的边缘或拐角粘合到底部填充使用粘性粘合剂在PCB上。使用DCB样品测试的具有相同尺寸和形状的倒角的边缘粘合和填充不足的样品在相同载荷下失效,因为PCB圆角界面附近的PCB中的应力分布仅是粘合剂圆角尺寸和形状的函数,并且最后,开发了一个内聚区模型(CZM)来预测底部填充的BGA-PCB组件中的PCB分层弯曲载荷。内聚参数是从弯曲测试样品的断裂测试中获得的,该测试样品由与底部填充胶粘合的PCB基板组成。该模型针对一定范围的PCB刚度,粘合剂圆角尺寸和应变率,提供了相对不足的BGA-PCB填充组件失效模式和断裂载荷的相对准确的预测。

著录项

  • 作者

    Akbari Roknabadi, Saeed.;

  • 作者单位

    University of Toronto (Canada).;

  • 授予单位 University of Toronto (Canada).;
  • 学科 Mechanical engineering.
  • 学位 Ph.D.
  • 年度 2017
  • 页码 222 p.
  • 总页数 222
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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