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Spectral properties of aluminium doped zinc oxide thin films prepared by SILAR method

机译:SILAR法制备的铝掺杂氧化锌薄膜的光谱特性

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摘要

The spectral properties of undoped and Al doped ZnO nano thin films prepared using double dip method otherwise called SILAR method (Successive Immersion Layer Adsorption Reaction) are reported. The thin films were having polycrystalline hexagonal structure. The optical properties of these films are studied and reported. The optical constants like the band gap (E g ), refractive indices (n, k), dielectric constant (ε), optical conductivity (σ), were estimated using an approximation algorithm developed from established procedures using transmittance spectrum of the thin films. The average excitation energy (E 0), oscillator strength (E d ), effective mass (m*), plasma frequency (ω p ), static dielectric constant (ε) and carrier concentration (N) are also estimated and reported. The highly transparent thin films showed nanowires protruding from stacked nanorods on SEM inspection that signifies the suitability of these thin films for gas sensors.
机译:报道了使用双浸法(也称为SILAR法)(连续浸没层吸附反应)制备的未掺杂和铝掺杂的ZnO纳米薄膜的光谱特性。薄膜具有多晶六边形结构。研究并报道了这些膜的光学性质。像带隙(E g ),折射率(n,k),介电常数(ε),光导率(σ)之类的光学常数是使用根据既定程序开发的近似算法估算的薄膜的透射光谱。平均激发能(E 0 ),振荡器强度(E d ),有效质量(m *),等离子频率(ω p )还估算并报告了静态介电常数(ε)和载流子浓度(N)。高度透明的薄膜在SEM检查中显示纳米线从堆叠的纳米棒中伸出,这表明这些薄膜适用于气体传感器。

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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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