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Effect of Packaging Architecture on the Optical and Thermal Performances of High-Power Light Emitting Diodes

机译:封装结构对大功率发光二极管的光学和热性能的影响

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摘要

The phosphor and die bonding configuration affect the optical efficiency and thermal performance in phosphor-coated white light emitting diodes (LEDs). In this paper, light emission studies reveal that the chromaticity shift and light extraction losses depend on the uniformity of phosphor particles deposited over the LED surface. A nonuniform and sparse phosphor layer affects the correlated color temperature (CCT) and the spectral Y-B ratio due to the disproportionate contribution of light emission between the LED device and the phosphor layer. Furthermore, the Y-B ratio was observed to reduce with temperature due to higher Stoke's energy and light extraction losses in the phosphor layer. As a result, the Y-B ratio exhibits an inverse relationship with the package's thermal resistance as a function of temperature. On the other hand, the thermal performance of a LED package is dependent on the die-bonding configurations (conventional and flip-chip). Due to the improved heat dissipation capabilities in flip-chip bonding, the temperature rise and thermal resistance of the package were observed to reduce with temperature. By alleviating the heat accumulation in the package, more stable colorimetric properties such as CCT and Y-B ratio can be achieved.
机译:磷光体和管芯键合配置会影响磷光体涂覆的白光发光二极管(LED)的光学效率和热性能。在本文中,发光研究表明色度偏移和光提取损耗取决于沉积在LED表面的荧光粉颗粒的均匀性。由于LED器件和荧光粉层之间的发光不均,不均匀且稀疏的荧光粉层会影响相关色温(CCT)和光谱Y-B比。此外,观察到由于较高的斯托克能量和磷光体层中的光提取损失,Y-B比随温度降低。结果,Y-B比与封装的热阻呈反比关系,而热阻随温度而变。另一方面,LED封装的热性能取决于芯片键合配置(常规和倒装芯片)。由于倒装芯片键合中改进的散热能力,因此观察到封装的温度升高和热阻随温度降低。通过减轻包装中的热量积聚,可以实现更稳定的比色特性,例如CCT和Y-B比。

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  • 来源
    《Journal of Electronic Packaging》 |2017年第3期|031003.1-031003.5|共5页
  • 作者单位

    Department of Avionics Systems, Nanyang Polytechnic, 180 Ang Mo Kio Avenue 8, Singapore;

    School of Engineering, University of Glasgow, Glasgow, United Kingdom;

    Department of Systems Power and Energy, University of Glasgow, Glasgow, United Kingdom;

    School of Engineering, University of Glasgow, Glasgow, United Kingdom;

    School of Engineering, University of Glasgow, Glasgow, United Kingdom;

    Department of Joining Technology, Singapore Institute of Manufacturing Technology, 2 Fusionopolis Way, Singapore;

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