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Properties of GaAs/AlGaAs quantum wells grown by MOVPE using vicinal GaAs substrates

机译:MOVPE使用邻近GaAs衬底生长的GaAs / AlGaAs量子阱的性质

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Low-temperature photoluminescence (PL) was used to optimize the structural and optical quality of 2-15 nm thick GaAs/AlGaAs quantum wells (QWs). GaAs wafers, misoriented off(1 00) towards < 1 1 1 > A and < 1 1 1 >B were used, covering the 0-0.6° misorientation range in steps of 0.1°. A dramatic reduction in the 10 K PL linewidth is observed for all 0.2-0.3° misorientations, as compared to nominally oriented wafers: on 2, 5 and 15 nm thick QWs, linewidths fall from 23, 8 and 3 meV to 6, 3 and 2.5 meV, respectively, among the narrowest reported to date for similar structures. Above 0.3° misorientation, the emission broadens to become, at 0.6°, comparable or worse than for the exact (100) samples. The 4 K electron mobility of two-dimensional electron gases grown on similar, misoriented substrates increases steadily and then decreases again at larger misorientations.
机译:低温光致发光(PL)用于优化2-15 nm厚的GaAs / AlGaAs量子阱(QW)的结构和光学质量。使用朝<1 1 1> A和<1 1 1> B错位偏离(1 00)的GaAs晶片,覆盖了0.1°范围内的0-0.6°错位范围。与标称取向的晶片相比,在所有0.2-0.3°取向错误的情况下,观察到10 K PL线宽的显着降低:在2、5、15 nm厚的QW上,线宽从23、8和3 meV下降到6、3和9 m​​eV。 2.5 meV,分别是迄今为止报道的同类结构中最窄的。超过0.3°的取向误差,在0.6°时,发射宽度会变得与精确的(100)个样品相当或更差。在相似的,取向错误的基板上生长的二维电子气的4 K电子迁移率稳定增加,然后在较大的取向错误时又降低。

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