首页> 外文期刊>Journal of Crystal Growth >Gas source MBE grown Al_(0.52)In_(0.48)P photovoltaic detector;
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Gas source MBE grown Al_(0.52)In_(0.48)P photovoltaic detector;

机译:气源MBE生长的Al_(0.52)In_(0.48)P光电探测器;

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摘要

Al_(0.52)In_(0.48)P photovoltaic detector has been fabricated using gas source molecular beam epitaxy and its characteristics have been measured in detail. The Al_(0.52)In_(0.48)P absorption layer shows a mismatch of +4.76 x 10~(-4) to the GaAs substrate with a full width at half maximum of 22.5 arcsec. The dark current is only 0.78 pA at reverse bias of 500 mV and the R_0A is about 1.7 x 10~8 Ωcm2 at room temperature. The measured peak responsivity at zero bias is 0.287 A/W at 470 nm with 50% cut-on and cut-off wavelengths at 440 and 495 nm, respectively.
机译:利用气体源分子束外延技术制备了Al_(0.52)In_(0.48)P光电探测器,并对其特性进行了详细的测量。 Al_(0.52)In_(0.48)P吸收层与GaAs衬底的错配为+4.76 x 10〜(-4),其半峰全宽为22.5 arcsec。在500 mV的反向偏置下,暗电流仅为0.78 pA,在室温下,R_0A约为1.7 x 10〜8Ωcm2。零偏压下测得的峰值响应度在470 nm处为0.287 A / W,分别在440和495 nm处有50%的截止波长和截止波长。

著录项

  • 来源
    《Journal of Crystal Growth》 |2011年第1期|p.501-503|共3页
  • 作者单位

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China,Graduate School of the Chinese Academy of Science, Beijing 100049, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China,Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China,Graduate School of the Chinese Academy of Science, Beijing 100049, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;

    Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A3. GSMBE; B2. Al_(0.52)In_(0.48)P; B3. Photovoltaic detector;

    机译:A3。 GSMBE;B2。 Al_(0.52)In_(0.48)P;B3。光伏探测器;

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