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The impact of vacancy defects on the performance of a single-electron transistor with a carbon nanotube island

机译:空位缺陷对具有碳纳米管岛的单电子晶体管性能的影响

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摘要

The single-electron transistor (SET) principle of operation is based on the Coulomb blockade (CB) phenomenon. The island material and associated defects have a direct impact on the range of the CB effect and the operating speed of the SET. In this research, the impact of vacancy defects on a SET-based on a carbon nanotube (CNT) is investigated. The results show that a SET with six atomic vacancies exhibits the lowest Coulomb diamond area and highest operating speed. The results also show that increasing the distance between two single vacancies decreases the Coulomb diamond area of the SET. Moreover, the location of the vacancies in the CNT and its effect on the operation of the SET are investigated. The comparison study shows that an antidote vacancy in the CNT close to the drain side results in the shortest CB range and narrowest bandgap, resulting in the CNT SET with the highest operating speed.
机译:单电子晶体管(设定)操作原理基于库仑阻断(CB)现象。岛材料和相关缺陷对CB效应的范围和集合的运行速度有直接影响。在本研究中,研究了基于碳纳米管(CNT)的基于碳纳米管(CNT)的空位缺陷的影响。结果表明,具有六个原子空缺的集合呈现最低的库仑钻石区域和最高的操作速度。结果还表明,增加两个单个空位之间的距离降低了该组的库仑菱形区域。此外,研究了CNT中空位的位置及其对集合的操作的影响。比较研究表明,靠近排水侧的CNT中的解毒装置导致最短的CB范围和最窄的带隙,导致具有最高操作速度的CNT集合。

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