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An ab Initio Calculations of Single-Electron Transistor Based Single Walled Carbon Nanotube of Ultra-Small Diameter

机译:单电子晶体管基于超小直径的单壁碳纳米管的AB Initio计算

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摘要

In this paper, we have investigated the charge stability diagram and conductance dependence on source drain bias and gate voltage of carbon nanotube based single electron transistor (SET) by using first principle calculations. All calculations have been executed by using ATK-VNL simulation package based on density functional theory (DFT). We have applied these calculations for carbon nanotube based SET; the nanotube has been placed just above the dielectric ( ) in between the source and drain electrodes of gold. The single walled carbon nanotube has been used in SET, which have ultra-small diameter and (4,0) configuration. The addition energy of the device has been calculated, which can be defined as the difference between the electron affinity, and ionization energies. The calculated values of energies have been found to be -10.17694 eV and -11.04034 eV for isolated phase and SET environment respectively. In electrostatic environment, the results were showing the regularization of molecular energy levels and therefore the addition energy reduced. The calculations for additional energies, variations of total energies to that of the gate voltages and charge stability diagram (CSD) have also been done in this study.
机译:在本文中,我们通过使用第一原理计算来研究了基于碳纳米管的单电子晶体管(设定)的源漏偏压和栅极电压的电荷稳定性图和电导依赖性。所有计算都是通过使用基于密度泛函理论(DFT)的ATK-VNL仿真包来执行。我们已经应用了基于碳纳米管的组合的计算;纳米管已在金的源极和漏极之间的电介质()上方放置在金子之间。单壁碳纳米管已用于组,具有超小直径和(4,0)配置。已经计算了装置的添加能量,其可以定义为电子亲和力和电离能之间的差异。已经发现计算的能量值为-10.17694eV和分离阶段和设定环境的10.11.04034eV。在静电环境中,结果显示分子能级的正则化,因此减少了添加能量。还在本研究中进行了额外能量,对栅极电压和电荷稳定图(CSD)的总能量的变化的计算。

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