首页> 外文期刊>Japanese journal of applied physics >Room-Temperature Carbon Nanotube Single-Electron Transistor with Defects Introduced by La(NO_3)_3 Process
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Room-Temperature Carbon Nanotube Single-Electron Transistor with Defects Introduced by La(NO_3)_3 Process

机译:La(NO_3)_3工艺引入缺陷的室温碳纳米管单电子晶体管

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摘要

The new fabrication process for a carbon nanotube (CNT) single-electron transistor (SET) operated at room temperature was proposed using La(NO_3)_3. The carbon nanotube reacts with oxygen included in La(NO_3)_3 at high temperature and the defects that worked as tunnel junctions were introduced. For consistency CNT-SET shows Coulomb oscillation and Coulomb diamond characteristics at 300 K. From the simulation, it was found that the newly proposed process introduced three effective defects into CNT, and CNT-SET worked as two islands SET.
机译:利用La(NO_3)_3提出了一种在室温下工作的碳纳米管(CNT)单电子晶体管(SET)的新制造工艺。碳纳米管在高温下与La(NO_3)_3中包含的氧发生反应,并引入了充当隧道结的缺陷。为了保持一致性,CNT-SET在300 K时显示出库仑振荡和库仑金刚石特性。通过仿真发现,新提出的工艺将三个有效缺陷引入到CNT中,并且CNT-SET充当了两个岛SET。

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