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首页> 外文期刊>Japanese journal of applied physics >Particle formation during deposition of SiO_x nanostructured thin films by atmospheric pressure plasma jet
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Particle formation during deposition of SiO_x nanostructured thin films by atmospheric pressure plasma jet

机译:大气压等离子体射流沉积SiO_x纳米结构薄膜的颗粒形成

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摘要

In this work, the results of SiOx thin film deposition by an atmospheric pressure plasma jet using HMDSO (hexamethyldisiloxane) as precursor are presented. The experiments were performed for different process parameters like initial applied power, substrate to nozzle distance and speed of the moving substrate holder. In order to determine the properties of deposited films the samples were analyzed by scanning electron microscopy, transmission electron microscopy, atomic force microscopy and profilometer. The formation mechanism of particles and their size distribution depending on the process parameters are described and discussed. The results show the possibility to change properties of deposited films and particle formation by tuning the experimental settings. (C) 2020 The Japan Society of Applied Physics.
机译:在这项工作中,介绍了使用HMDSO(六甲基二硅氧烷)作为前体的大气压等离子体射流的SiOx薄膜沉积的结果。对不同的工艺参数进行实验,如初始施加的电力,衬底到喷嘴距离和移动基板支架的速度。为了确定沉积膜的性能,通过扫描电子显微镜,透射电子显微镜,原子力显微镜和轮廓仪分析样品。描述和讨论了根据工艺参数的颗粒的形成机制及其尺寸分布。结果表明,通过调整实验设置来改变沉积的薄膜和颗粒形成的性能。 (c)2020日本应用物理学会。

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  • 来源
    《Japanese journal of applied physics》 |2020年第sh期|SHHE06.1-SHHE06.10|共10页
  • 作者单位

    Al Farabi Kazakh Natl Univ IETP Al Farabi 71 Alma Ata 050040 Kazakhstan|Inst Appl Sci & Informat Technol Shashkina 40-48 Alma Ata 050038 Kazakhstan;

    Univ Kiel Inst Expt & Appl Phys Leibnizstr 11-19 D-24098 Kiel Germany;

    Univ Kiel Inst Expt & Appl Phys Leibnizstr 11-19 D-24098 Kiel Germany;

    Al Farabi Kazakh Natl Univ IETP Al Farabi 71 Alma Ata 050040 Kazakhstan;

    Univ Kiel Inst Expt & Appl Phys Leibnizstr 11-19 D-24098 Kiel Germany;

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