首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Silicon Nitride Film Deposition by Photochemical Vapor Deposition Using an Argon Excimer Lamp
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Silicon Nitride Film Deposition by Photochemical Vapor Deposition Using an Argon Excimer Lamp

机译:使用氩准分子灯通过光化学气相沉积法沉积氮化硅膜

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摘要

In this paper, we report the deposition of silicon nitride (SiN_x) films for the production of semiconductor devices and flat panel displays, by chemical vapor deposition with vacuum ultraviolet excimer lamps (VUV-CVD) using SiH_4 and NH_3 as raw materials. An Ar_2~* excimer lamp (λ = 126 nm, hv = 9.8 eV) with a high photon energy was used to directly excite and dissociate SiH_4 through a photochemical reaction. SiN_x films were successfully formed at a low temperature of 100℃ with the Ar_2~* excimer lamp. Although the Si-rich films were obtained using an Ar_2~* lamp, they showed a quality almost similar to that of films obtained by conventional plasma-CVD at 400℃.
机译:在本文中,我们报告了通过使用SiH_4和NH_3作为原料的真空紫外准分子灯(VUV-CVD)进行化学气相沉积来沉积用于生产半导体器件和平板显示器的氮化硅(SiN_x)膜。具有高光子能量的Ar_2〜*准分子灯(λ= 126 nm,hv = 9.8 eV)用于通过光化学反应直接激发和解离SiH_4。用Ar_2〜*准分子灯在100℃的低温下成功形成了SiN_x薄膜。尽管使用Ar_2〜*灯获得了富硅膜,但它们的质量几乎与传统的等离子CVD在400℃下获得的膜相似。

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