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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Amorphous Silicon Film Deposition from SiH_4 by Chemical Vapor Deposition with Argon Excimer Lamp
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Amorphous Silicon Film Deposition from SiH_4 by Chemical Vapor Deposition with Argon Excimer Lamp

机译:氩准分子灯通过化学气相沉积法从SiH_4中沉积非晶硅膜

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摘要

We have deposited amorphous silicon thin films from monosilane (SiH_4) gas by photochemical vapor deposition using a vacuum ultraviolet excimer lamp (VUV-CVD). We used an argon excimer lamp (λ = 126 nm, hv = 9.8 eV) whose photons are strongly absorbed by SiH_4 gas. The substrate temperatures were changed from 25 to 300℃. When the temperature was lower than 150℃, the films included H-Si-H units and H_2 molecules in its structure. When it was higher than 150℃, the main structural unit was Si-H.
机译:我们已经使用真空紫外准分子灯(VUV-CVD)通过光化学气相沉积法从甲硅烷(SiH_4)气体中沉积了非晶硅薄膜。我们使用了一个氩准分子灯(λ= 126 nm,hv = 9.8 eV),其光子被SiH_4气体强烈吸收。基板温度从25℃更改为300℃。当温度低于150℃时,薄膜的结构中包含H-Si-H单元和H_2分子。高于150℃时,主要结构单元为Si-H。

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