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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Thin-Film Deposition of Metal Oxides by Aerosol-Assisted Chemical Vapour Deposition: Evaluation of Film Crystallinity
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Thin-Film Deposition of Metal Oxides by Aerosol-Assisted Chemical Vapour Deposition: Evaluation of Film Crystallinity

机译:气溶胶辅助化学气相沉积法对金属氧化物的薄膜沉积:膜结晶度的评估

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摘要

Sn-doped In_2O_3 (ITO) thin films are deposited on glass substrates using 0.2 M aqueous and methanol solutions of InCl_3(4H_2O) with 5mol% SnCl_2(2H_2O) by aerosol-assisted chemical vapour deposition under positive and negative temperature gradient conditions. The film crystallinity is evaluated by determining the film thickness dependence of X-ray diffraction peak height. When using aqueous solution, the ITO films grow with the same crystallinity during the deposition, but when using methanol solution, the preferred orientation of ITO changes during the deposition.
机译:在正负温度梯度条件下,通过气溶胶辅助化学气相沉积,使用0.2 M的InCl_3(4H_2O)和5mol%SnCl_2(2H_2O)的InCl_3(4H_2O)水溶液和甲醇溶液,将Sn掺杂的In_2O_3(ITO)薄膜沉积在玻璃基板上。通过确定X射线衍射峰高的膜厚依赖性来评价膜的结晶度。当使用水溶液时,ITO膜在沉积期间以相同的结晶度生长,但是当使用甲醇溶液时,ITO的优选取向在沉积期间改变。

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