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机译:使用极紫外显微镜研究可印刷相缺陷的临界尺寸:II。孔坑缺陷的可打印阈值区域的定义
Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamigori, Hyogo 67i-1205, Japan,CREST, JST, Yonbancho, Chiyoda, Tokyo 102-0081, Japan;
R&D Center, Asahi Glass Co., Ltd., 1150 Hazawacho, Kanagawa-ku, Yokohama 221-8755, Japan;
Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamigori, Hyogo 67i-1205, Japan,CREST, JST, Yonbancho, Chiyoda, Tokyo 102-0081, Japan;
Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamigori, Hyogo 67i-1205, Japan,CREST, JST, Yonbancho, Chiyoda, Tokyo 102-0081, Japan;
Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamigori, Hyogo 67i-1205, Japan,CREST, JST, Yonbancho, Chiyoda, Tokyo 102-0081, Japan;
机译:使用极紫外显微镜研究可印刷相缺陷的临界尺寸
机译:使用EUV显微镜研究可印刷相缺陷的临界尺寸
机译:程序化的极端紫外线基板缺陷的可印刷性的光刻特征
机译:使用EUVL掩模中编程的相位缺陷进行实验性相位缺陷可印刷性评估
机译:本机空白缺陷和编程缺陷的可打印性及其堆栈结构
机译:极紫外光刻掩模上基板和吸收体缺陷的可印刷性