...
首页> 外文期刊>Japanese journal of applied physics >Structural and optical properties of boron-doped amorphous carbon nitride thin films synthesized by microwave electron cyclotron resonance-plasma chemical vapor deposition
【24h】

Structural and optical properties of boron-doped amorphous carbon nitride thin films synthesized by microwave electron cyclotron resonance-plasma chemical vapor deposition

机译:微波电子回旋共振等离子体化学气相沉积法合成掺硼非晶氮化碳薄膜的结构和光学性质

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The structural and optical properties of boron (B)-doped amorphous carbon nitride (a-CN_x) thin films with a B content of less than 10 at. % were investigated. The B-doped a-CN_x thin films were synthesized by electron cyclotron resonance (ECR)-plasma chemical vapor deposition (CVD) by varying the substrate temperature and flow rate ratio of the source gases (BCl_3/CH_4/N_2/Ar). An increase in the B content and a decrease in the Cl content were observed with increasing substrate temperature. The Tauc energy gap of the B-doped a-CN_x thin films increased with decreasing C-N sp~2 bond fraction and increasing B content. The photoluminescence (PL) peak position showed larger blue shifts and a tendency of increased integrated PL intensity was observed with increasing B content. These PL results suggest an increase in PL-active B-related sp~2 C-C bond cluster density.
机译:B含量小于10 at。的掺硼(B)的非晶氮化碳(a-CN_x)薄膜的结构和光学性质。 %被调查。通过改变衬底温度和原料气体的流量比(BCl_3 / CH_4 / N_2 / Ar),通过电子回旋共振(ECR)-等离子体化学气相沉积(CVD)合成了掺B的a-CN_x薄膜。随着基板温度的升高,观察到B含量的增加和Cl含量的降低。 B掺杂的a-CN_x薄膜的Tauc能隙随着C-N sp〜2键分数的降低和B含量的增加而增加。光致发光(PL)峰位置显示出较大的蓝移,并且随着B含量的增加,观察到积分PL强度增加的趋势。这些PL结果表明PL-活性B相关的sp〜2 C-C键簇密度增加。

著录项

  • 来源
    《Japanese journal of applied physics》 |2014年第7期|071002.1-071002.5|共5页
  • 作者单位

    Ibaraki National College of Technology, Hitachinaka, Ibaraki 312-8508, Japan;

    Tsuyama National College of Technology, Tsuyama, Okayama 708-8509, Japan;

    Tsuyama National College of Technology, Tsuyama, Okayama 708-8509, Japan;

    Okayama University of Science, Okayama 700-0005, Japan;

    Department of Electronics and Informatics, Faculty of Science and Technology, Ryukoku University, Otsu 520-2194, Japan;

    Department of Electronics and Informatics, Faculty of Science and Technology, Ryukoku University, Otsu 520-2194, Japan;

    Department of Electronics and Informatics, Faculty of Science and Technology, Ryukoku University, Otsu 520-2194, Japan;

    Okayama University of Science, Okayama 700-0005, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号