Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy

摘要

We have investigated the organic semiconductor thin films deposited by vacuum evaporation deposition using intersecting metal shadow masks on indium tin oxide (ITO) electrode/glass substrates to simulate organic solar cells by simultaneous observation with dynamic force microscopy (DFM)/Kelvin-probe force microscopy (KFM). The energy band diagram was depicted by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM. We considered the charge behavior at the interface having band bending in the phenyl-C-61-butyric acid methyl ester (PCBM) film. (C) 2015 The Japan Society of Applied Physics