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Measuring and Imaging Permittivity of Insulators Using High-Frequency Eddy-Current Devices

机译:使用高频涡流设备测量和成像绝缘子的介电常数

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This paper shows that the high-frequency eddy-current (HFEC) measurement devices can be used not only for characterizing conductivity and magnetic permeability related properties of electrically conductive materials, but also for permittivity characterization of insulators. Maxwell’s equations, finite-element method simulations, and experimental research are applied to support this hypothesis. An industrial HFEC device is used to measure the change of dielectric properties during the curing process of the epoxy resin L20. The measurement results are in good agreement with the expected behavior of the parameters relative permittivity and tan during cure. Using a capacitive reference device, similar characteristics regarding the change of the complex permittivity of the resin can be observed. In addition, HFEC imaging results on polymethyl methacrylate are presented, discussed, and compared with capacitive imaging. HFEC permittivity mapping benefits from a high spatial resolution with a sensitivity and penetration depth that is at least comparable with those of capacitive imaging technology.
机译:本文表明,高频涡电流(HFEC)测量设备不仅可用于表征导电材料的电导率和磁导率相关特性,而且还可用于绝缘子的介电常数特性。麦克斯韦方程组,有限元方法模拟和实验研究被用于支持这一假设。工业HFEC设备用于测量环氧树脂L20固化过程中介电性能的变化。测量结果与固化期间参数相对介电常数和棕褐色的预期行为非常吻合。使用电容性基准器件,可以观察到与树脂的复介电常数的变化类似的特性。另外,介绍,讨论了HFEC在聚甲基丙烯酸甲酯上的成像结果,并将其与电容成像进行了比较。 HFEC介电常数测绘得益于高空间分辨率,其灵敏度和穿透深度至少可与电容成像技术相媲美。

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