首页> 外国专利> CIRCUIT FOR MEASURING COMPLEX PERMITTIVITY, DEVICE FOR MEASURING COMPLEX PERMITTIVITY, AND METHOD FOR MEASURING COMPLEX PERMITTIVITY

CIRCUIT FOR MEASURING COMPLEX PERMITTIVITY, DEVICE FOR MEASURING COMPLEX PERMITTIVITY, AND METHOD FOR MEASURING COMPLEX PERMITTIVITY

机译:用于测量复杂电容的电路,用于测量复杂电容的装置以及用于测量复杂电容的方法

摘要

To provide a method for determining the cause of deterioration of electrolytic solution of a lubricating oil and a storage battery, and a method of measuring complex permittivity used to monitor the change of components in a food production line.SOLUTION: The embodiment of the present invention calculates a complex dielectric constant of dielectrics to be measured using the electrostatic capacitance Cand the complex dielectric constant of a dielectric substrate by calculating the electrostatic capacitance Cby assuming that the admittance in the atmosphere of this comb-shaped electrode substrate is measured and that the comb-shaped electrode simple substance is floating in the atmosphere, and by measuring the admittance in the state where the electrode surface of the comb electrode substrate is covered with a dielectrics of bigger thickness at least than the pitch of a comb-shaped electrode to be measured, using a comb-shaped electrode substrate on which a comb-shaped electrode whose electrode pitch is smaller than the thickness of the above-mentioned substrate is formed on one side of the dielectric substrate of a known complex dielectric constant.SELECTED DRAWING: Figure 9
机译:提供一种用于确定润滑油和蓄电池的电解液劣化的原因的方法以及一种用于监测食品生产线中成分变化的复介电常数的测量方法。解决方案:本发明的实施方式通过计算静电电容C来计算介电质的复数介电常数,方法是使用静电电容C来计算介电质的复数介电常数,方法是假设已测量该梳状电极基体在大气中的导纳,并且梳状结构形状的电极单质漂浮在大气中,通过以至少比被测量的梳状电极的间距大的厚度的电介质覆盖梳状电极基板的电极表面的状态下的导纳,使用梳状电极基板,其上的梳状电极电极间距小于已知衬底介电常数已知的介电衬底一侧上形成的上述衬底的厚度。图9

著录项

  • 公开/公告号JP2019028012A

    专利类型

  • 公开/公告日2019-02-21

    原文格式PDF

  • 申请/专利权人 TOHOKU DENSHI SANGYO KK;

    申请/专利号JP20170150517

  • 发明设计人 YOSHIDA TETSUO;SHIRAIWA AYUMI;

    申请日2017-08-03

  • 分类号G01N27/22;

  • 国家 JP

  • 入库时间 2022-08-21 12:21:50

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