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Complex permittivity measuring device and complex permittivity measuring method

机译:复杂介电常数测量装置和复杂介电常数测量方法

摘要

PROBLEM TO BE SOLVED: To provide a technique that enables highly precise, easy measurement of complex dielectric constant even with an inhomogeneous sample, and to provide a technique that enables highly precise, easy measurement of complex dielectric constant even with a measurement system to which analytical methods are not easily applicable.;SOLUTION: A computation unit 1 computes an S parameter from an entered complex dielectric constant using a numerical calculation model. A measurement system 2 measures S parameter of a sample placed in a transmission line. A determination unit 3 estimates a complex dielectric constant of the sample by comparing the S parameter computed by the computation unit 1 and the S parameter measured by the measurement system 2.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2019,JPO&INPIT
机译:要解决的问题:提供一种能够高精度,易于测量复合介电常数的技术,即使是不均匀的样本,也提供了一种能够高精度,易于测量复合介电常数的技术,即使使用分析的测量系统 方法不容易适用。;解决方案:计算单元1使用数值计算模型从输入的复介质常数计算S参数。 测量系统2测量放置在传输线中的样品的S参数。 确定单元3通过比较由计算单元1计算的S参数和由测量系统2测量的S参数来估计样本的复介质常数。所选绘图:图1;版权:(c)2019,JPO和INPIT

著录项

  • 公开/公告号JP6981847B2

    专利类型

  • 公开/公告日2021-12-17

    原文格式PDF

  • 申请/专利权人 応用地質株式会社;

    申请/专利号JP20170214900

  • 发明设计人 高橋 一徳;

    申请日2017-11-07

  • 分类号G01N22;

  • 国家 JP

  • 入库时间 2022-08-24 22:54:57

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